SEMI and SST Announce 2012 “Best of West” Award Winner

SEMI and SST Announce 2012 “Best of West” Award Winner

At SEMICON West 2012, Solid State Technology and SEMI announced the recipient of the 2012 “Best of West” Award — Jordan Valley Semiconductor for its QC‐TT defect inspection system.  The award recognizes important product and technology developments in the microelectronics supply chain. Held in conjunction with SEMICON West, the largest and most influential microelectronics exposition in North America, the Best of West finalists were selected based on their financial impact on the industry, engineering or scientific achievement, and/or societal impact.

Jordan Valley Semiconductor’s QCTT defect inspection system solves key issues in the use of 450mm wafers in a manufacturing environment, where wafers are subjected to more handling steps and the thermal stresses on larger wafers are much higher. This makes the wafers more prone to breakage, which can be predicted using the QC‐TT. The system can also identify the slip and other crystalline defects in wafers, which may not have catastrophic effects on the substrate integrity but will contribute to a reduction in yield.

The selection of finalists was made by a prestigious panel of judges representing a broad spectrum of the microelectronics industry.

July 11, 2012