SEMI PV Test Methods for Feedstock Materials, Bricks, and Wafer Workshop Proceedings 2012

SEMI® International Standards Program

SEMI Photovoltaic Test Methods for Feedstock Materials, Bricks, and Wafer Workshop Proceedings

InterSolar Europe 2012 , Munich, Germany

Thursday, June 14, 2012.

 Agenda 
 
 Instructions:  Click on top of each title to download pdf file for each presentation.  To download all presentations, click HERE (Zip file) 16,543 KB
 
  
TitlePresenters
  
Session 1: Test Methods for Silicon Feedstock Materials and IngotsSession Chair: R. Hockett, EAG
    
Limitation of Solar Cell Efficiency by Oxygen and Metal ImpuritiesK. Bothe, Institute for Solar Energy Research
    
Use of SEMI PV1 in the PV Industry: Strengths and WeaknessesK. Putyera, EAG
    
Use of SEMI PV25 in the PV Industry: Strengths and WeaknessesL. Wang, EAG
  
ICP-MSH. Gotts, Air Liquide
    
 SEMI PV10 and its Application P. Wagner
 
 
Session 2: Test Methods for Silicon Bricks and WafersSession Chair: H. Aulich
    
Advanced in-line characterization and sorting of crystalline silicon photovoltaic wafersTh. Jaehrling, Semilab
 
 
Comparison of RF-PCD and MW-PCD Lifetime Measurements on Silicon Wafers and BricksK. Lauer, CiS Forschungsinstitut für Mikrosensorik und Photovoltaik
 
 
A Technical Comparison of the Five SEMI Standard Documents on LifetimeR. Sinton, Sinton Instruments
 
Characterization and Qualitative Assessment of Silicon Wafers by Photoluminescence Imaging at Room TemperatureB. Birkmann, Schott Solar Wafer GmbH
 
SEMI Test Methods under DevelopmentP. Wagner
 
In-line Characterization of Photovoltaic WafersK. Herrmann, Hennecke Systems
 
Certified Reference Materials: Status and NeedsJ.-T. Håkedal, Elkem Solar
 
  

Standards Contact Information:

Yann Guillou
SEMI Grenoble Office
Email: yguillou@semi.org
Phone: +33 4 3878 3971

James Amano
Director, SEMI International Standards
Email: jamano@semi.org
Phone: +1.408.943.7977