SEMI PV Test Methods for Feedstock Materials, Bricks, and Wafer Workshop Proceedings 2012

SEMI^® International Standards Program

SEMI Photovoltaic Test Methods for Feedstock Materials, Bricks, and Wafer Workshop Proceedings

InterSolar Europe 2012 , Munich, Germany

Thursday, June 14, 2012.

Agenda
Instructions: Click on top of each title to download pdf file for each presentation. To download all presentations, click HERE (Zip file) 16,543 KB

Title	Presenters

Session 1: Test Methods for Silicon Feedstock Materials and Ingots	Session Chair: R. Hockett, EAG

Limitation of Solar Cell Efficiency by Oxygen and Metal Impurities	K. Bothe, Institute for Solar Energy Research

Use of SEMI PV1 in the PV Industry: Strengths and Weaknesses	K. Putyera, EAG

Use of SEMI PV25 in the PV Industry: Strengths and Weaknesses	L. Wang, EAG

ICP-MS	H. Gotts, Air Liquide

SEMI PV10 and its Application	P. Wagner

Session 2: Test Methods for Silicon Bricks and Wafers	Session Chair: H. Aulich

Advanced in-line characterization and sorting of crystalline silicon photovoltaic wafers	Th. Jaehrling, Semilab

Comparison of RF-PCD and MW-PCD Lifetime Measurements on Silicon Wafers and Bricks	K. Lauer, CiS Forschungsinstitut für Mikrosensorik und Photovoltaik

A Technical Comparison of the Five SEMI Standard Documents on Lifetime	R. Sinton, Sinton Instruments

Characterization and Qualitative Assessment of Silicon Wafers by Photoluminescence Imaging at Room Temperature	B. Birkmann, Schott Solar Wafer GmbH

SEMI Test Methods under Development	P. Wagner

In-line Characterization of Photovoltaic Wafers	K. Herrmann, Hennecke Systems

Certified Reference Materials: Status and Needs	J.-T. Håkedal, Elkem Solar

Standards Contact Information:

Yann Guillou
SEMI Grenoble Office
Email: yguillou@semi.org
Phone: +33 4 3878 3971

James Amano
Director, SEMI International Standards
Email: jamano@semi.org
Phone: +1.408.943.7977