Silicon Wafer Standards Meeting Schedule at NA Spring 2015

Silicon Wafer Standards Meeting Schedule at NA Spring 2015

 Monday, March 30, 2015

 

08:30-09:30

Int’l SOI (TF)

Agenda

09:30-10:30

Int'l Epitaxial (TF)

Agenda

10:30-12:00

Int’l Test Methods (TF)

Agenda

13:00-14:00

Int'l Automated Advanced Surface Inspection (TF)

Agenda

14:00-:17:00

Int’l Advanced Wafer Geometry (TF)

Agenda

 

 

 

Tuesday, March 31, 2015

08:30-10:00

Int’l 450 mm Wafer (TF)

 

Agenda

10:00-12:00

Int’l Polished Wafer (TF)

13:00-14:00

Int'l Terminology (TF)

Agenda

14:00-17:00

Silicon Wafer (C)

Agenda