Silicon Wafer Standards Meeting Schedule for NA Spring 2013

 Monday, April 1, 2013

 

09:00-10:00

Int'l Annealed Wafer/Int'l Epitaxial (TFs)

Agenda

10:00-11:00

Int’l 450 mm Wafer (TF)

Agenda

11:00-12:00

Int’l Polished Wafer (TF)

Agenda

13:30-17:00

Int’l Advanced Wafer Geometry (TF)

Agenda

Tuesday, April 2, 2013

 

 

09:00-10:00

Int’l SOI (TF)

Agenda

 

10:00-11:00

Int’l Test Methods (TF)

Agenda

 

11:00-12:00

Int’l Advanced Surface Inspection (TF)

Agenda

 

13:00-16:00

Silicon Wafer (C)

Agenda