MSIG Webinar: Process Control and Root Cause Analysis for More-than-Moore and Advanced IC Technologies

MSIG Webinar: Process Control and Root Cause Analysis for More-than-Moore and Advanced IC Technologies

Wednesday, Apr 25, 2018
08:00 AM – 09:00 AM
Wednesday, Apr 25, 2018
at 08:00 AM to at 09:00 AM
Online, United States


Join us for a FREE webinar on process control and root cause analysis for advanced IC technologies, provided by Applied Materials' Daniel Harel, Director of Product Line Management and RD&E at Applied Materials.

Mr. Harel will address current technology challenges and methods of enhancing production quality for defect review, wafer inspection and CD-SEM. The webinar will include a comprehensive case study which demonstrates options for wafer inspection and defect review. Following the presentation we anticipate a few minutes to answer questions submitted during the session. Questions during the live webinar should be submitted via the online control panel available during the webinar.



Registration Details

Webinar Registration is FREE and open to all. 


Agenda

Daniel Harel
Director of Process Diagnostics and Control, Equipment Product Group (EPG)
Applied Materials

Daniel Harel is the Director of Process Diagnostics and Control at Applied Materials for the Equipment Product Group (EPG) within the Applied Global Services division. In this role, he manages the engineering and project team that is focused on growing Applied’s legacy PDC business and on accelerating innovation through new product development initiatives.  

Daniel brings over 20 years of technology-focused product experience in emerging technology segments. Prior to joining Applied, Daniel held various development positions at Unique Technologies and Philips Healthcare in Israel. He holds degrees from Israel’s Bar Ilan University in both Physics and Computer Sciences.