CAST Test Cell Software Integration Workshop
October 6, 2009
SEMI Headquarters
3081 Zanker Road
San Jose, CA 95134

Thank you to those who participated at this workshop. You can view the updates by clicking on the links within the agenda below.

9:00am–9:30am

“Framer” Problem Statement: Don Hartman, Ph.D.

9:30am–11:30am

Round Table with presentations from the following:

OSAT (Amkor)

IDM (Intel)Desired State (Items in green) are of most interest to Intel

Fabless (Qualcomm)

Customer view (Verigy)

Discussion from the floor from Optimal Test, Pintail, Salland, etc. Handler & Prober companies

"Lessons learned for Work Group Management”

11:30am–12:00pm

Form major problem statements for each of the 3 Working Groups

12:00pm–1:00pm

Working Lunch for working groups

1:00pm–3:00pm

Break into Groups

Yield Enhancement: Keith Arnold

Test Cell Communication: Len VanEck

List/define the data source and data receivers in and around the test cell.

• What those sources/receivers are today
  What is the current flow of data through a typical test cell.
• Begin to partition those sources/receivers with the goal of determining where the best place is for them to reside (this may mean breaking up where they reside in the current test cell set up).
• Start forming a picture that would lead to a "state machine" type of approach to the data flow in a test cell.

Test Cell communication background and historical reference

STDF: Ajay Khoche

3:00pm–4:00pm

Group presentation, analysis, summary

For Summary of the Test Cell Communication/Yield Enhancement Working Groups, click here

For summary of the STDF Working group, please click here.