The Collaborative Alliance for Semiconductor Test (CAST) was formed in 2008 by semiconductor device makers and test industry suppliers to engage in and resolve common industry issues related to higher test equipment utilization, lower costs, and greater standardization and return on test-related R&D. For those who are new to CAST, this kickoff meeting will provide the vital background information as well as an update on the current initiatives. Through communication of our charter and the launch of the technical working groups, we hope to broaden the participation to include as many representatives from the user community and equipment suppliers as possible.

Many initial areas of interest have been identified and will be discussed in further detail during the afternoon breakout sessions. However, we are also openly soliciting other areas of interest to help refine the group’s focus and priorities. Your inputs are welcomed and are essential to the ultimate success of the group.

To be a member of CAST, click here.

9:00 Welcome and introductions - John Adams, Teradyne (Click here to download CAST meeting: Kick Off PDF)

9:15 Keynote of trends and need for CAST, cooperation & standardization – Omer Dossani, Senior Director of Test PLM, STATSChipPAC, Inc. (Click here to download CAST meeting: standardization PDF)

9:45 Vision, charter & how we got here. - Don Edenfeld, Intel (Click here to download CAST meeting: Scope and Objectives PDF)

10:15 Break

10:30 Brief overview of areas of focus, direction of breakouts, prioritization of opportunities - Mark Roos, Roos Instruments (Click here to download CAST meeting: Opportunities PDF)

11:00 Update on status of current initiatives – Breakout session leaders

11:30 Panel discussion of focus areas, leading into idea generation for standards consideration (interactive dialogue betweenpanel & audience) - Don E. (Intel), Omer (STATS ChipPAC), and John A. (Teradyne)

12:30 Lunch

1:30 Breakout sessions:

• Docking and Mounting – John Adams, Teradyne
  Docking and Mounting Workgroup Outcome
• Test Cell Communication, including SECS/GEM Standards - Len VanEck, LTX-Credence
  (Click here to download CAST meeting: Live breakout session PDF)
  Test Cell Communication Workgroup Outcome
• STIL: Common Dialects - Paul Roddy, Advantest
  (Click here to download CAST meeting: Live breakout session PDF)
  STIL Workgroup Outcome
• Common STDF Format & Customization Syntax/API - AJ Khoche, Verigy
  STDF Workgroup Outcome
• Yield Enhancement - Don Edenfeld, Intel
  Yield Enhancement Workgroup Outcome
• Bench top and PTIM Standards - Luke Schreier, National Instruments
  PTIM Workgroup Outcome

3:30 Reconvene

4:00 Adjourn

SEMI Global Headquarters
3081 Zanker Road
San Jose, CA 95134

Registration was free to all CAST and also non-CAST members.

Contact Thomas Morrow at: tmorrow@semi.org, or 408-943-7948

http://www.semi.org/cast