• 10:30–2:30pm: The New Test SolutionsTechXPOT will address the latest innovations in test technologies and ideas that meet today's need for lower costs, system solutions, and new test requirements.
• 1:30–3:30pm: The New Test StrategiesTechXPOT will provide insights into the new test strategies and test challenges by the leading device makers, experts and OSATS.
• 3:45–4:45pm: To end the day, we'll have an Executive Test Summit. All four major ATE companies’ CEO/Presidents will participate. Rick Nelson will moderate this panel which will consist solely of Q&A.

These sessions will take place in San Francisco’s Moscone Center, South Hall. TechXPOTs are free, but you must register. Space is limited.

You are encouraged to participate in one or more of these CAST workgroup sessions. Everyone is invited and attendance is free.

Salon 5

• 8:30–11:30am: Test Cell Communication, chaired by Len Van Eck : Agenda
  
• 11:30am–2:30pm: STIL, chaired by Jim O’Reilly
  
• 2:30–4:30pm: STDF, chaired by Ajay Khoche: Agenda

Salon 6

• 8:30–11:30am: Yield Enhancement Working Group, chaired by Keith Arnold
  
• 11:30am–2:30pm: Tester Docking and Mounting, chaired by P. Roddy/Doug Lefevr
  
• 2:30–4:30pm: PTIM (Portable Test Instrument Module), chaired by Chris White/NI
  
• 4:30–6:00pm: NA ATE Standards Committee meeting
  

These meetings will occur in the San Francisco Marriott, 55 Fourth St. (Yerba Buena Level).

For more information on SEMICONWest 2009, go to: http:/www.semiconwest.org.