Collaborative Alliance for Semiconductor Test (CAST) presents:
CAST 2017 Workshop —Testing Smarter
Date: Thursday, May 4th and Friday, May 5th, 2017
Location: SEMI Headquarters, 673 South Milpitas Blvd, Milpitas, California
Semiconductor Test is changing from the classic go/no-go testing of old to approaches that require smarter methods that can drive real-time improvements in product yield, quality, and reliability. This workshop will pull together experts in the field to discuss two aspects – component SLT (System Level Test); and improved methods that enable real-time data transfer and management.
For SLT, we will hear from early adopters on questions such as:
- What is driving more products to use SLT and why?
- What SLT approaches are being taken and where in the test flow?
- What are the industry issues and barriers facing SLT today?
- What are opportunities for improvement using SLT?
Attendees will then interactively discuss the challenges and opportunities of SLT to seek pre-competitive solutions that will enable its adoption.
On the topic of enhanced data management, CAST has two working groups (TEMS and RITdb) that are actively developing solutions for real-time data transport and management so that it can be applied to such applications as adaptive test, etc. The working group members will give an update on their progress and early adopters will share their working examples to highlight the potential benefits.
Please mark your calendars for this 2-day event which promises to give attendees the opportunity to discuss these challenges and opportunities, while learning from industry peers in SEMI’s pre-competitive environment.
Thursday, May 4 (Day 1 of 2)
|8:00 am||Registration & Breakfast|
|8:30 am||Welcome & Introductions||Paul Trio, SEMI and|
|9:00 am||System Level Test (SLT) Perspectives||Invited speakers include:|
AMD, Astronics, Cisco, Nvidia, PDF Solutions
|10:00 am||Coffee Break & Networking|
|10:30 am||Open Discussions on SLT Approaches, Opportunities, and Challenges|
|11:30 am||Conclusions on CAST Role(s) to Enable Adoption of SLT|
|1:00 pm||Overview of the RITdb Project|
(Rich Interactive Test Database)
|2:20 pm||The RITdb Data and Processing Models
|3:30 pm||Overview of the TEMS Project|
(Tester Event Messaging for Semiconductors)
|4:00 pm||The DAS (Data Application Server)
|5:00 pm||Day 1 - Closing Remarks|
Friday, May 5 (Day 2 of 2)
|8:15 am||TEMS Case Study #1: Real Time Viewer
|9:00 am||TEMS Case Study #2: Shmoo Analyzer
Keith Thomas, Teradyne and
|10:00 am||The RITdb Specification
|11:00 am||RITdb Case Study: Streaming RITdb
|12:00 noon||Lunch & Networking|
|1:00 pm||RITdb and TEMS Working Group Sessions|
|4:00 pm||Day 2 - Workshop Conclusion / Closing Remarks|
Questions on the program?
CAST (Collaborative Alliance for Semiconductor Test) is a SEMI Special Interest Group (SIG). SEMI SIGs provide a forum that fosters discussion and aligns stakeholders on industry-critical issues. CAST was formed in 2008 by semiconductor device makers and test industry suppliers to engage in and resolve common industry issues related to higher test equipment utilization, lower costs, and greater return on investment. In 2009, CAST became a SEMI Special Interest Group. Its charter includes fostering pre-competitive collaboration as well as developing and promoting standards that enable industry productivity improvements.