CAST 2017 Workshop - Testing Smarter


Collaborative Alliance for Semiconductor Test (CAST) presents:

CAST 2017 Workshop —Testing Smarter

Date: Thursday, May 4th and Friday, May 5th, 2017
Location: SEMI Headquarters, 673 South Milpitas Blvd, Milpitas, California

Semiconductor Test is changing from the classic go/no-go testing of old to approaches that require smarter methods that can drive real-time improvements in product yield, quality, and reliability. This workshop will pull together experts in the field to discuss two aspects – component SLT (System Level Test); and improved methods that enable real-time data transfer and management.

For SLT, we will hear from early adopters on questions such as:

  • What is driving more products to use SLT and why?     
  • What SLT approaches are being taken and where in the test flow?
  • What are the industry issues and barriers facing SLT today?
  • What are opportunities for improvement using SLT?

Attendees will then interactively discuss the challenges and opportunities of SLT to seek pre-competitive solutions that will enable its adoption.

On the topic of enhanced data management, CAST has two working groups (TEMS and RITdb) that are actively developing solutions for real-time data transport and management so that it can be applied to such applications as adaptive test, etc. The working group members will give an update on their progress and early adopters will share their working examples to highlight the potential benefits.

Please mark your calendars for this 2-day event which promises to give attendees the opportunity to discuss these challenges and opportunities, while learning from industry peers in SEMI’s pre-competitive environment.

 

SPONSORS 

 
    

AGENDA

Thursday, May 4 (Day 1 of 2)

8:00 am Registration & Breakfast
 
  
8:30 am Welcome & Introductions Paul Trio, SEMI and
Ron Leckie,
INFRASTRUCTURE Advisors
9:00 am System Level Test (SLT) Perspectives Invited speakers include:
AMD, Astronics, Cisco, Nvidia, PDF Solutions
10:00 am Coffee Break & Networking
 
  
10:30 am Open Discussions on SLT Approaches, Opportunities, and Challenges
 
  
11:30 am Conclusions on CAST Role(s) to Enable Adoption of SLT
 
  
12:00 noon Lunch
 
  
1:00 pm Overview of the RITdb Project
(Rich Interactive Test Database)
  • Objectives (translation from STDF, expanded capabilities, ITRS data roadmap support, datalog validation, machine-processable spec.)
  • Current Targets & Status (data log, equipment inventory, translator)
  • Future Efforts & Use Cases (E-test, Assembly, SLT, Electronic Assy.)
 Stacy Ajouri,
Texas Instruments
2:20 pm The RITdb Data and Processing Models
  • Machine-to-machine (IoT) based Data Distribution
  • Stream vs. File Modes
  • Use Case Examples
  • Test Architecture for Specification Validation
  • Global Data Distribution
 Mark Roos,
Roos Instruments
3:00 pm Break
 
  
3:30 pm Overview of the TEMS Project
(Tester Event Messaging for Semiconductors)
  • Objectives & Status
  • How TEMS Defines Communications between Tester and DAS   
 Keith Thomas,
Teradyne
4:00 pm The DAS (Data Application Server)
  • How to Create a DAS
  • What can be done with a DAS
  • Simple Examples
 Steven McDowall,
Mentor Graphics
5:00 pm Day 1 - Closing Remarks  

 

Friday, May 5 (Day 2 of 2)

8:00 am Breakfast
 
  
8:15 am TEMS Case Study #1: Real Time Viewer
  • a real-time that produces statistical plots for engineering debug
 

Keith Thomas, Teradyne and
Steven McDowall,
Mentor Graphics

 
9:00 am TEMS Case Study #2: Shmoo Analyzer
  • a tool to deliver shmoo data in database format for offline analysis
 

Keith Thomas, Teradyne and
Steven McDowall,
Mentor Graphics

9:45 am Break
 
  
10:00 am The RITdb Specification
  • Document overview; specRITdb construction, viewing, and use
 Stacy Ajouri,
Texas Instruments 
11:00 am RITdb Case Study: Streaming RITdb
  • demo of a test bed for real time rule checking and playback
 Don Hartman
(Industry Consultant)
12:00 noon Lunch & Networking
 
  
1:00 pm RITdb and TEMS Working Group Sessions
 
  
4:00 pm Day 2 - Workshop Conclusion / Closing Remarks  

 

Questions on the program? 
Paul Trio
ptrio@semi.org

Background:
CAST (Collaborative Alliance for Semiconductor Test) is a SEMI Special Interest Group (SIG). SEMI SIGs provide a forum that fosters discussion and aligns stakeholders on industry-critical issues. CAST was formed in 2008 by semiconductor device makers and test industry suppliers to engage in and resolve common industry issues related to higher test equipment utilization, lower costs, and greater return on investment. In 2009, CAST became a SEMI Special Interest Group. Its charter includes fostering pre-competitive collaboration as well as developing and promoting standards that enable industry productivity improvements.