Session 15: Inline Inspection
In Situ Materials Characterization
Wednesday, June 21, 2017
3:55 PM - 4:20 PM
This paper will describe the method of characterization of optical thin films during the deposition process that allows the coating engineer to understand and adjust the properties of optical films during deposition. A test case set up will be used to describe the method whilst characterizing the effect of a specific film during deposition and the resultant exposure to atmosphere.
Bryan is the founder of NVision instruments and developer of the first broadband optical monitor.
NVision Instruments Inc