ASMC 2018




SEMI Advanced Semiconductor Manufacturing Conference
ASMC 2018
April 30– May 3, 2018
Saratoga Hilton, Saratoga Springs, New York




The ASMC 2018 agenda was developed by a technical committee representing a large cross section of the device, equipment/materials industry, and academia. Technical presentations are the result of an industry-wide call for papers, and accepted abstracts reflect manufacturing issues which are significant and current. Select ASMC manuscripts are republished in a Special Section of the IEEE Transactions on Semiconductor Manufacturing. ASMC 2018 will include the Women in Semiconductors (WiS) program.


ASMC is the leading international technical conference for exploring solutions to improve the collective micro-electronics manufacturing expertise. The conference, with technical sponsorship from IEEE EDS and CPMT, provides an unparalleled platform for semiconductor professionals to network and learn the latest information in the practical application of advanced manufacturing strategies and methodologies.  ASMC 2018 features fifteen technical sessions including our popular interactive poster session. The conference also includes a panel discusssion on 'Industry 4.0 and the Evolution of Smart Semiconductor Manufacturing'

  • Session 1 - Defect Inspection I
  • Session 2 - Factory Optimization I
  • Session 3 - Yield Management
  • Session 4 - Advanced Metrology I
  • Session 5 - Interactive Posters
  • Sessions 6 - Advanced Process Improvement
  • Session 7 - Advanced Patterning/Design for Manufacturabilty
  • Session 8 - Defect Inspection II
  • Session 9 - Contamination Free Manufacturing
  • Session 10 - Factory Optimization II
  • Session 11 - Advanced Metrology II
  • Session 12 - Advanced Process Control
  • Session 13 - Factory Optimization III
  • Session 14 - Defect Inspection III
  • Session 15 - Advanced Materials and Photonics











  Mukesh V. Khare, Ph.D.
Vice President, Semiconductor Technology Research
IBM Research



Anda Mocuta, Ph.D.
Director, Technology Solutions & Enablement





Robert Maire
Semiconductor Advisors



 Big Data Analytics and the Smart Factory in Microelectronics Manufacturing

Prof. James Moyne
Associate Research Scientist, Mechanical Engineering
University of Michigan, Applied Materials

ASMC 2018 Sponsors






Congratulations to 2017 Best Paper Award Winners


2017 Best Paper Award

Sponsored by Entegris

Chasing Ghosts:  How an SRAM Detected the Subtle Impact of Stray Light 
Stephen Lucarini, Bachir Dirahoui, Richard Hafer, Weihao Weng, Laura Safran, Sweta Pendyala, Karl Barth, Timothy Brunner, Zhigang Song, Brett Engel, David Clark, Keliang He, Cathy Gow, Anne Friedman, GLOBALFOUNDRIES

2017 Best Student Paper


Enhanced Voltage Silicon NFET-MESFET Cascode Amplifiers Integrated on a 45nm SOI CMOS Technology for RFIC Applications
Payam H. Mehr, W. Lepkowski, S. Moallemi, J. Kitchen and T. J. Thornton, Arizona State University




Sponsorship Opportunities
Reach out to decision makers involved in all aspects of semiconductor manufacturing, and the microelectronics supply chain by sponsoring ASMC. To find out about the available promotional opportunities contact: Take a look at the 2017 post show report. Shane Poblete / Tel: +1.202.847.5983

 Mail list
Make sure you receive the latest information about ASMC.  Add your name to the ASMC distribution list.

Conference Questions
Margaret Kindling
Tel: +1.202.393.5552