ASMC 2016

AGENDAREGISTERATTENDEESTRAVELSPONSORSHIPAUTHOR KIT
Didn't attend ASMC 2016? Here's what you missed.
 
The Economy of Things: How Cognitive IoT Is Driving New Business Models
Don O’Toole, Business Development Executive, IBM Watson IoT Alliances & Ecosystem Business Development
IBM Corporation
Christine Furstoss
Advanced Manufacturing… Changing Today’s Paradigm
Christine Furstoss, VP and Technical Director, Manufacturing & Materials Technologies
GE Global Research
Robert Maire
Is China Driving the Urge to Merge?
Robert Maire, President 
Semiconductor Advisors
Jesus del AlamoNanoscale III-V CMOS 
Jesús A. del Alamo, Director, Microsystems Technology Labs, Massachusetts Institute of Technology
 
Panel Discussion
Moore's Law Wall vs. Moore's Wallet, and Where Do We Grow From Here? 
 
Panelists:
  • David Bloss, Vice President, Technology Manufacturing Group; Director, Fab Equipment, GSM, Intel Corporation
  • William Miller, Sr. Director of Engineering, Qualcomm
  • Andreas Knorr, Director of Technology Research, GLOBALFOUNDRIES
  • Patrick Martin, Head of Field Technology, Transistor and Interconnect, Applied Materials
  • Paul Werbaneth, Global Product Marketing Director, Intevac  (moderator)

Here's what past attendees say about ASMC:
The schedule of the ASMC 2015 was perfect, with the right time for technical. Enough breaks to address additional questions and to network.   There was a lot of face time with key customers.   I learned a lot about yield issues and solutions, especially for BEOL. I also got in contact with two suppliers who will very likely help me with a specific yield / process control issues I am currently facing in the field. 
Mike von den Hoff, Director of Marketing, KLA-Tencor 

Who attends ASMC?

  • IC Manufacturers
  • Equipment Manufacturers
  • Materials Suppliers
  • Chief Technology Officers
  • Operations Managers
  • Process Engineers
  • Product Managers
  • Academia...

ASMC 2015 Best Paper Award, sponsored by Entegris
"Big Data Emergence in Semiconductor Manufacturing Advanced Process Control" by James Moyne, Jamini Samantaray, Mike Armacost, Applied Materials

ASMC 2015 Best Student Paer Award, sponsored by GLOBALFOUNDRIES​​
"Inspection Step Modeling for Defect Source Tool Identification Using Defectivity Control"
 by Mohamad Chakaroun, Rabah Messouci, Mohand Djeziri, Mustapha Ouladsine, Aix Marseille Universite, CNRS, ENSAM, Universite de Toulon; Jacques Pinaton, Process Control System, STMicroelectronics


Justify Your Attendance
Use the testimonial above and our justification letter template to show why your participation ASMC 2016 will benefit you and your organization. 


Mail list
Make sure you receive the latest information about ASMC 2016.  Add your name to the ASMC distribution list.

ASMC Committee

SEMI thanks the ASMC committee members, who volunteer countless hours in support of our annual conference.

 

 

 

2016 Corporate Sponsors:

Air Liquide Logo




 





Edwards Vacuum
 

FEI logo
 

GreeneTweed Logo

KLA-Tencor


 


 

Nikon





Valqua America

 

Technical/Supporting Sponsors

IEEE

CMPT

EDS

SEDC Logo

 

Sponsorships

Sponsorship opportunities for this event are available.  To become a sponsor, contact Shane Poblete at
spoblete@semi.org or 1.202.847.5983

Author Kit

Authors presenting a technical paper at ASMC 2016, please visit the author kit for due dates, templates and additional information.