The Fundamentals of Digital Semiconductor Testing
The Fundamentals of Digital Semiconductor Testing – The Test Engineer’s Reference Manual
By Soft Test ©2002
It had been designed to be the “cook book” and reference guide for test, product and applications engineers. This reference book is chocked full of everything digital test engineers need to know about the concepts and techniques used in testing digital semiconductors. In fact, it condenses many years of test engineering experience into a single reference manual.
Topics covered? It explains DC, AC and functional tests in detail, with major points illustrated and elaborate on various test methods-providing the advantages and disadvantages of each method. The “Hows and Whys” of each test method are revealed. As an example, for the DC test discussion, a data log example shows all possible “pass” and “fail” conditions and a trouble shooting guide outlines the steps needed to identify and solve problems related to each individual test.
The Fundamentals of Digital Semiconductor Testing also includes the latest developments in digital semiconductor test, including the following new topics (and more):
- Structural defects
- Defect-oriented testing
- Fault coverage
- Design-for testability
- Scan, BIST, JTAG, IDDQ and Structural Test
Other Resources
The Fundamentals of Mixed Signal Testing
Pricing Information
|
SEMI Member |
$90.00 |
|
Non Member |
$100.00 |
|
|||||||||||||
