SEMI Announces Recipients of 2009 SEMI Japan Standards Awards

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SEMI Announces Recipients of 2009 SEMI Japan Standards Awards at SEMICON Japan 2009

SEMI honored Mr. Terry Asakawa (Tokyo Electron) with the SEMI Japan Standards Award, which recognizes SEMI Standards member for his/her outstanding contributions to the development of standards for the semiconductor and related industries. SEMI also respectively presented four industry experts with the SEMI International Collaboration Award and JRSC Special Appreciation Award. The SEMI Standards awards were announced at the “SEMI Standards Friendship Reception and Member Recognition Awards Ceremony” held on December 3 evening, the second day of SEMICON Japan 2009.

[From left to right: Mr. Yoichi Iga (NEC Electronics), Mr. Hiroshi Kondo (Muratec Automation), Mr. Terry Asakawa (Tokyo Electron), Dr. Naoyuki J. Kawai (Renesas Technology), and Mr. Masaaki Kawaguchi (Daifuku)]

For more than 15 years, Terry Asakawa has consistently taken worldwide initiative in the SEMI Standards activities based on his high level expertise and leadership. He chaired the Japan Physical Interfaces and Carriers Committee and Factory Integration division during the latter half era of 300mm Standards era. In the 2000’s, he chaired the JRSC (Japan Regional Standards Committee) and made tremendous contributions to improve the framework for standards development. In 2009, he played an essential role in establishing the Japan PV Committee and is now diligently navigating the Committee’s activities.

The SEMI Japan Standards Award, the highest Standards honor bestowed in SEMI Japan region, is awarded to individuals who have made significant contributions to the SEMI International Standards program and to the development of semiconductor and related industry standards. It is given by SEMI, on behalf of JRSC.

In addition to the SEMI Japan Standards Award, SEMI bestowed awards in multiple categories to four other recipients. Categories and recipients include:

  • The International Collaboration Award – presented to following two contributors respectively.
  • Mr. Hiroshi Kondo (Muratec Automation), who contributed in establishing basic concepts for 300mm Standards through the development of GJG, followed by the AMHS Standards activity as a SEMI Standards program.
  • Mr. Yoichi Iga (NEC Electronics), who played a key role in developing SEMI T20, Specification for Authentication of Semiconductors and Related Products, which will have a broad impact across the whole industry.

The JRSC Special Appreciation Award–given in recognition of the outstanding contributions to Standards activities in a specific area, to the following members respectively.

Dr. Naoyuki J. Kawai (Renesas Technology), who has been making enormous contributions to international committee activity by facilitating good communication with the members in other regions as a co-chair of Japan Silicon Wafer Committee

Mr. Masaaki Kawaguchi (Daifuku), who has been making tremendous efforts to facilitate an international collaborative work for the 450mm Physical Interfaces and Carriers activities

SEMI also appreciates the achievements in Technical Committees and Task Forces by presenting the Technical Committee Awards at Technical Committee meetings, which goes to 32 outstanding Standards members this year.

SEMI Japan Standards Award


Terry Asakawa, Tokyo Electron Limited


SEMI International Collaboration Award



Youichi Iga, NEC Electronics Corporation


JRSC Special Appreciation Award


Masaaki Kawaguchi, Daifuku Co., Ltd.

Naoyuki J. Kawai, Renesas Technology Corp.


Technical Committee Award


PI&C Committee

  • Takao Nojima, Intel K.K.
  • Yasushi Taniyama, SINFONIA TECHNOLOGY CO., LTD.
  • Tsuyoshi Nagashima, Miraial Co., Ltd.

I&C Committee

  • Yoshihisa Takasaki, DAINIPPON SCREEN MFG. CO., LTD.
  • Hiroshi Kondo, Muratec Automation Co., Ltd.
  • Takashi Terasaki, NIPPON PULSE MOTOR Co,.Ltd.
  • Hideaki Ogihara, MKS Instruments Japan, Inc.
  • Takahito Matsuzawa, Tokyo Electron Software Technologies Limited

Traceability Committee

  • Hideaki Ogihara , MKS Instruments Japan, Inc.
  • Andy Ohwada, Adem Ltd.
  • Hirokazu Tsunobuchi, Keyence Corp.
  • Kiyokazu Iida, Fujitsu Microelectronics Ltd.
  • Takashi Aoki, JIPDEC
  • Atsuhiro Yamagishi, Information-TECHNOLOGY Promotion Agency
  • David Brown, Intel Corporation
  • Yaw Obeng, NIST

EHS Committee

  • Kenji Sugihara, Panasonic Corporation
  • Takao Nojima, Intel K.K.
  • Hidekazu Minato, NSS Ltd.
  • Minoru Araki, QSES Inc.
  • Kaoru Nogawa, Safe Techno Limited
  • MorayCrawford, Hatsuta Seisakusho Co, Ltd
  • Hisashi Aihara, Takenaka Corporation

Silicon Wafer Committee

  • Masaharu Watanabe, NuFlare Technology Inc.
  • Tetsuo Fukuda, Fujitsu Microelectronics Ltd.
  • Tsutomu Morimoto, Kobe Steel, Ltd.

Metrics Committee

  • Kenichi Mukai, Hewlett-Packard Japan, Ltd.
  • Junji Iwasaki, Semiconductor Leading Edge Technologies,Inc.(Selete)
  • Michiyuki Shimizu, Semiconductor Leading Edge Technologies,Inc.(Selete)

FPD Color Filter & Optical Elements Committee

  • Yoshihiko Shibahara, FUJIFILM Corporation

FPD Mask Committee

  • Shigeru Oba, Covalent Materials Corporation