Workshop on Metrology and Standards for Nanoelectronics
We, the members of the WMSN-MtM organizing committee, invite you to participate in and to submit poster papers for the one-day Workshop on Metrology and Standards for Nanoelectronics: More than Moore Applications (WMSN-MtM). The Workshop will be held on Monday, 17 May 2010, Grenoble, France, in conjunction with the Sixth International Nanotechnology Conference on Communications and Cooperation (INC6). INC6 will be held on the following days, 18-20 May 2010, in Grenoble, France. This is your opportunity to foster communication and cooperation and to identify pressing measurement and associated standards infrastructure needs and gaps in the area of nanoelectronics for more than Moore (MtM) applications.
Who Should Participate?
Anyone with professional interests in nanoelectronics and their associated metrology and standards activities. We look forward to your participation and contributions.
Registration, agenda, and more complete details about the Workshop are on-line at
A Unique Opportunity
This Workshop provides you a unique opportunity to learn about and contribute to measurements and standards for advancements in nanoelectronics. The Workshop covers all stages of the economic cycle from research to end-of-useful life and recycling or disposal.
MtM applications include the domains of
1) RF and Analog/Mixed-Signal technologies,
2) Energy (e.g., solar, photovoltaics, smart grid, and storage-batteries),
3) Imaging (e.g., quantitative medical imaging),
4) Sensor/Actuators (e.g, biosensors),
5) Bio-Chips (e.g., bioelectronics), and
6) 3D Heterogeneous Integration.
The Workshop will consist of four sessions for invited oral presentations and a session for contributed poster papers. In the final-summary Session, a panel of experts will lead interactive discussions with the audience on the measurement and standards needs identified by the speakers in Sessions 1-4. The purposes of this final Session are to:
- Identify the most critical challenges in standards and measurements for selected MtM applications;
- Determine whether agreement exists on the priorities for addressing the challenges;
- Determine whether meeting those critical challenges requires technical innovation or better infrastructure for deploying existing technologies;
- Identify who should provide the solutions;
- Suggest how to bring them together to provide solutions.
Commerce, Standards, and Related Measurements
International commerce in nanoelectronics requires technically validated standards and related measurements that are suitable for use in any nation. These standards must therefore be developed with input from all stakeholders. Effective international standards will facilitate wider use of products that offer greater functionality or performance through nanoelectronics-enabled subsystems. Such standards will also enhance the health and safety aspects of products for the protection of researchers, manufacturers, consumers, and the environment.
Nanoelectronics standards and related measurements are significant for success at all stages of innovation because:
- Global competition is intense: It is Imperative that the best of each nation’s technology be included in internationally-developed specifications, standards, and related measurements.
- Innovation in nanoelectronics depends on standards and measurements: These should be based on solid science and engineering. Standards not so based may constrain innovation and entrench inadequate technologies. Documents on consensus specifications advance the field.
- Metrology and Standards are key: Success depends on addressing adequately the highly multi-disciplinary and broad-based nature of nanoelectronics.
- Standards and measurements influence R&D and business models: Optimum R&D funding and business models for nanoelectronics enterprises depend greatly on correct standards and measurements that are accepted by all international stakeholders.
WMSN-MtM Organizing Committee
Herbert S. Bennett, Co-Chairman, National Institute of Standards and Technology
Norbert Fabricius, Karlsruhe Institute of Technology
Evelyn Hirt, Pacific Northwest National Laboratory
Greg Monty, Underwriters Laboratories
David G. Seiler, Co-Chairman, National Institute of Standards and Technology
John Tucker, Keithley Instruments
Wilfried Vandervorst, Interuniversity Microelectronics Center
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