NA Si Wafer Standards Spring 2010 Meetings


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NA Silicon Wafer Meeting Agendas

Location: (Room 4 in Executive Briefing Center)

Intel

Robert Noyce Building

2200 Mission College Blvd

Santa Clara, CA 95054

Monday, March 29, 2010

 

Time

Meeting Name

 

08:30-10:00

Int'l Test Methods (TF)

Agenda

10:00-11:00

Int'l Polished Wafer (TF)

Agenda

11:00-12:00

Int'l Si. Wafer Terminology (TF)

Agenda

13:00-14:00

Int'l Advanced Surface Inspection (TF)

Agenda

14:00-16:30

Int'l Advanced Wafer Geometry (TF)

Agenda

Tuesday, March 30, 2010

 

Time

Meeting Name

 

08:30-11:00

Int'l 450 mm Wafer (TF)

Agenda

11:00-12:30

Int'l Epi Wafer (TF)

Agenda

13:30-16:30

Silicon Wafer (C)

Agenda

All these meetings will be accessible by teleconference and Web Meeting:

Call-in Numbers (toll free):

US 1 866 721 5561

Germany 0800 0006854

Japan 00531121598

All other countries (Click Here)

Participant code: 843137#

Click here to attend Live Meeting

Meeting ID: HDGQZ9