NA Si Wafer Standards Spring 2010 Meetings
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NA Silicon Wafer Meeting Agendas
Location: (Room 4 in Executive Briefing Center)
Intel
Robert Noyce Building
2200 Mission College Blvd
Santa Clara, CA 95054
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Monday, March 29, 2010 | ||
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Time |
Meeting Name | |
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08:30-10:00 |
Int'l Test Methods (TF) | |
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10:00-11:00 |
Int'l Polished Wafer (TF) | |
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11:00-12:00 |
Int'l Si. Wafer Terminology (TF) | |
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13:00-14:00 |
Int'l Advanced Surface Inspection (TF) | |
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14:00-16:30 |
Int'l Advanced Wafer Geometry (TF) | |
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Tuesday, March 30, 2010 | ||
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Time |
Meeting Name | |
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08:30-11:00 |
Int'l 450 mm Wafer (TF) |
Agenda |
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11:00-12:30 |
Int'l Epi Wafer (TF) | |
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13:30-16:30 |
Silicon Wafer (C) | |
All these meetings will be accessible by teleconference and Web Meeting:
Call-in Numbers (toll free):
US 1 866 721 5561
Germany 0800 0006854
Japan 00531121598
All other countries (Click Here)
Participant code: 843137#
Click here to attend Live Meeting
Meeting ID: HDGQZ9
