Automated Test Equipment Technical Standards Committee Formed


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North American Automated Test Equipment Standards Committee Formed

Today’s economic crisis and the industry’s quest for lower “cost of test” has created a stronger push for greater collaboration in the semiconductor test industry. Unfortunately, the absence of a SEMI North American (NA) Standards Automated Test Equipment (ATE) Committee has resulted in standards development by multiple ad-hoc groups, which makes it difficult to follow the many groups that are supporting the semiconductor test community.

The newly approved North America ATE Committee will consolidate ongoing efforts from other ad-hoc standards organizations – in particular, the six active, ongoing industry efforts listed below will be converted into SEMI Standards Task Forces.

  • Tester Docking and Mounting
  • Test Cell Communication, including SECS/GEM Standards
  • STIL: Common Dialects
  • Common STDF Format & Customization Syntax/API
  • ATE Software Interface
  • Bench top and PTIM Standards

Additional new standards activities will be initiated as needed

The NA ATE Committee will work closely with the Japan Test Committee, as well as related Standards committees such as the Information & Control Committee and EH&S Committee to ensure that efforts are synchronized.

The ATE Committee will be holding its initial meeting on July 15th at SEMICON West 2009 in San Francisco, California. To register for the meetings, please visit http://dom.semi.org/web/wstandards.nsf/NAWest09Reg?OpenForm.

Additional Information About Standards Meetings at SEMICON West 2009

http://www.semi.org/en/Standards/CTR_029399

For more information about this effort, please email James Amano at jamano@semi.org.