SEMI Announces Recipient of 2007 International Standards Awards
Karel Urbanek Award Bestowed on Ms. Kazuko Ikeda
SAN FRANCISCO, Calif. – July 18, 2007 – Last night, SEMI honored Ms. Kazuko Ikeda with the Karel Urbanek Award, which recognizes industry technologists for their outstanding contributions to the development of standards for the semiconductor and related industries. SEMI also presented six industry executives with SEMI North American Standards Awards. The SEMI Standards awards were announced at a reception held on the second day of SEMICON West 2007.
The Karel Urbanek Memorial Award, the highest Standards honor bestowed by SEMI, is awarded to individuals who have made significant contributions to the SEMI International Standards program and to the development of semiconductor, FPD and related industry standards. It is named in honor of the late Karel Urbanek, co-founder of Tencor Instruments, a former member of the SEMI Board of Directors and a dedicated leader of the SEMI International Standards program.
“We are pleased to recognize the great efforts put forth by Ikeda-san for her tenacity in helping to coordinate JEITA and SEMI standards activities,” said Stanley T. Myers, president and CEO of SEMI. “Her work has been instrumental in enabling SEMI to become a truly global organization for the worldwide semiconductor industry.”
Ms. Ikeda successfully led the Japan Silicon Wafer Committee for 11 years from 1995 to 2006, during which she took strong leadership of developing 300mm wafer specifications and other related standards. In addition, she served on the Japan Regional Standards Committee (JRSC), contributing her extensive knowledge of silicon applications for various devices, including discrete, bipolar and MOS.
Urbanek Award recipients are selected by the International Standards Committee, the governing board for the SEMI International Standards Program. Nominations for the other standards awards are made by the SEMI North America Standards staff and standards committee leaders, with the winners selected by a vote of the standards program members.
In addition to the Karel Urbanek Award, SEMI bestowed SEMI Standards Awards in multiple categories to six other recipients. Categories and recipients include:
The Merit Award – presented to a standards volunteer for making a major contribution to the semiconductor industry through the SEMI Standards program – George Celler, SOITEC USA
- The Technical Editor Appreciation Award – given in recognition the yeoman service done by individual standards volunteers – Dave Walsh, Standards Technology Group
- The Leadership Award – given to an individual for providing outstanding leadership in guiding the SEMI Standards Program – Frank Flowers, FMC
- The Corporate Device Member Award – presented to an individual who is acting officially or unofficially as corporate representative from a device manufacturer for outstanding contributions to the development of SEMI Standards – Harvey Wohlwend, ISMI
- The Honor Award – presented to an individual who has demonstrated long-standing dedication to the advancement of SEMI Standards – Rob Henry, Thermo Fisher Electron and Stephen Sumner, Entegris.
The SEMI Standards Program, established in 1973, covers all aspects of semiconductor process equipment and materials, from wafer manufacturing to test, assembly and packaging, in addition to the manufacture of flat panel displays and micro-electromechanical systems (MEMS). About 1,500 volunteers worldwide participate in the program, which is made up of 17 global technical committees. Visit www.semi.org/standardsfor further details about SEMI Standards.
SEMI is a global industry association serving companies that provide equipment, materials and services used to manufacture semiconductors, displays, nano-scaled structures, micro-electromechanical systems (MEMS) and related technologies. SEMI maintains offices in Austin, Beijing, Brussels, Hsinchu, Moscow, San Jose (California), Seoul, Shanghai, Singapore, Tokyo and Washington, D.C. For more information, visit www.semi.org.
Bettina Weiss/SEMI International Standards
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