High-k, solar energy, and test highlight agenda of SEMICON West 2007

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High-k, solar energy, and test highlight agenda of SEMICON West 2007

SEMICON West, the global microelectronics industry's seminal annual event, opens its doors in six weeks with a focus on the current trends and technologies that are driving the future of semiconductors, energy applications, MEMS, and nanoelectronics.

Among the buzz-worthy topics expected on the show floor are the continuing breakthroughs in new materials, the explosive growth in renewable energy applications and "clean tech," and the growing importance and industry focus on semiconductor test.

Exhibits badge registration is FREE through Friday, June 8. Starting June 9 though July 13, registration will cost $50; from July 14 through the show, registration will be $75. Register at www.semiconwest.org/Visitors/Register.

High-k all the way

Heralded as the greatest breakthrough and the biggest change in transistor technology in more than 30 years, high-k materials will be the subject of many agendas at SEMICON West, including keynotes from microprocessor giants AMD and Intel. High-k will also be among the issues covered at the Challenges in Device Scaling TechXPOT, located in North Hall.

Solar energy's bright future

With oil prices climbing and concerns over global warming occupying the news on a daily basis, renewable and clean energy applications are gaining greater attention. Last year, SEMICON West introduced energy as a segment within the Emerging Technologies and Markets TechXPOT. The focus has expanded for 2007 with keynotes on solar energy from Cypress Semiconductor Founder (and SunPower Chairman) T.J. Rodgers, and Rhone Resch, president of the Solar Energy Industries Association (SEIA), in addition to technical sessions on the Emerging Technologies TechXPOT stage (West Hall, Level 2)

New Semiconductor Test Summit

Continued device shrinks and increasingly complex device design and function are presenting increased challenges in the area of semiconductor test. No longer relegated to the "back end," test must be considered even during the design phase of semiconductor development. For the first time, the leaders of the ATE industry will meet at SEMICON West to discuss, explore, and debate the issues surrounding test at the first SEMI Test Summit and Reception, Wednesday, July 18, 5:30pm–6:30pm, on the Test, Assembly and Packaging TechXPOT stage (West Hall, Level 2). Rick Nelson, chief editor of Test and Measurement World, will moderate the executive panel, which includes R. Keith Lee, president and CEO of Advantest America; Lavi Lev, president and CEO of Credence; Tim Moriarty, president of Nextest; Mark E. Jagiela, president, Semiconductor Test Division, Teradyne; and Keith L. Barnes, president, CEO, and director of Verigy.

Complete information about SEMICON West 2007 is available online at www.semiconwest.org.