SEMI Award for North America Recipients


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SEMI Award North America Recipients

Year

Recipient

Contribution

Area

2012Mark Bohr, Intel

Robert Chau, Intel

Suman Datta, Pennsylvania State University (formerly with Intel)

Mark Doczy, Intel

Brian Doyle, Intel

Tahir Ghani, Intel

Jack Kavalieros, Intel

Matthew Metz, Intel

Kaizad Mistry, Intel

The Intel team was honored for their contribution to the first development, integration and introduction of a successful high-k dielectric and metal electrode gate stack for CMOS IC production, first implemented at the 45nm node in 2007Process and Technology Integration
2011Moungi Bawendi, MIT professor, QD Vision Science Advisory Board
Vladimir Bulovic, MIT professor, QD Vision Science Advisory Board, QD Vision founder
Seth Coe-Sullivan, QD Vision founder and CTO
John Ritter, QD Vision, EVP of Product Development and Operations
Jonathan S. Steckel, QD Vision founder and director of Chemistry
Commercialization of Quantum Dot (QD) technologyMaterials and Process Integration
2010Thomas DiStefano, Founder, Tessera

John Smith, former CEO, Tessera

Michael Warner, former VP Engineering & Product Development, Tessera
Commercialization of the uBGA TechnologyAdvanced Packaging

2009

Robert Patti

Pioneer work in the emerging technical area of 3D IC integration

Assembly and Packaging

2009

Andrew Hawryluk
James McWhirter
Michael Thompson
Yun Wang

Annealing using grazing-angle IR laser beams

Wafer Fabrication

2008

Yoshio Nishi

Memory Development and Visionary R&D Management

Lifetime Achievement

2008

Chris Auth

Mark Bohr

Robert Chau

Tahir Ghani

Kaizad Mistry

Anand Murthy

Scott Thompson

Process Integration of Strain-enhanced Mobility Techniques for CMOS Transistors

Process Integration

2007

Bernard S. Meyerson

SiGe for Wireless Application

Lifetime Achievement

2007

C. Grant Willson

Chemically Amplified Resist

Lithography

2006

Igor Khandros

Wafer Test

Test Equipment

2005

Jim Koford

Integrated Circuit Design and Test Automation

Lifetime Achievement

 

Bob Shillman, Bill Silver and Marilyn Matz

Machine Vision Systems

Enabling Equipment

2004

Lee Galbraith

George Kren

Particle Detection System

Metrology

2003

Arthur Evan

Blade Type Fixed-Point Probe Card

Test Equipment

 

Chris Mack

Lithography Modeling

Lithography

2002

Richard Spanier

Metrology

Lifetime Achievement

Tom Hedges

Tom Schaefer

Carl Smith

Roger Sturgeon

Mark Zimmer

Device Design-to-Manufacturing Data Transcription and Data Preparation Software

Design Database

Glenn Tom, Ph.D.

Karl Olander, Ph.D.

Safe Delivery System (SDS) Gas Storage and Delivery

Materials Technology

2001

Robert Knollenberg, Ph.D

Particle detection in semiconductor processing

Metrology

Paul Allen, Ph.D.

Hans Buhre,

Neil Berglund, Ph.D.

Torbjorn Sandstrom, Ph.D.

Anders Thuren

Paul Warkentin, Ph.D.

Team for Photo mask laser pattern generation technology

Lithography

2000

Doug Scott

John DeBolt

Jonathan Golovin

Team for Manufacturing Execution Systems and Development of PROMIS & COMETS

Factory Integration

Anwar Chitayat

Innovator and Developer of the Brushless Linear Motor

Enabling Equipment

1999

Anthony Bonora and

Mihir Parikh, Ph.D.

Creation and Development of

SMIF

Equipment

1998

Bruce Deal, Ph.D.

Silicon oxidation technology

Lifetime Achievement

William Cote,

William Guthrie, and

Michael Leach

Pioneering development of

chemical mechanical planarization processing

Process Technology

1997

Peter Rose, Ph.D.

Innovator/founder; ion implantation technology

Lifetime Achievement

Norman Goldsmith and

Werner Kern

"RCA clean"; oxide CVD; BN

diffusion

Process Technology

1996

Kenneth Levy

Leadership in inspection,

instrumentation and metrology

Lifetime Achievement

Robert Akins Ph.D.,

John Bruning,

Chris Sparkes, and

Larry Thompson

Optical tooling and

processes for deep UV

lithography

Equipment

Richard Brewer

Materials and process

solutions for Lithography

Materials

1995

Vincent Coates

Scanning electron microscope

Metrology

Arnon Gat

Rapid thermal processing

Process Equipment

1994

Martin Hammond

LPCVD

Materials Technology

Paul Sandland

Automated wafer inspection

Metrology Equipment

1994

Dan Maydan,

David N.K. Wang, and

Sasson Somekh

Precision 5000

Lifetime Achievement

1993

Marjorie Balazs

Yield Improvement

Process Control

1992

Griffith Resor

Wafer stepper development

for IC Production

Process Equipment

1991

Robert Mazur

Automatic spreading

resistance probe

Metrology

1990

Charles & Lucia Shipley

Positive photoresist

Materials Technology

1989

David Perloff

Wafer mapping

Metrology

Walter Runyan

Silicon crystal growth

Materials Technology

1988

Douglas Peltzer

Oxide isolation

technology

Process Technology

Ronald Hershel and

Martin Lee

One-to-one wafer

stepper

Process Equipment

Dan Maydan,

David Wang and

Sasson Somekh

Plasma etch standard

Process Equipment

1987

Dick Blair,

Charles Drexel and

Dan LeMay

Mass flow controller

Process Equipment

Mord Wiesler

Die bonding

Assembly Equipment

Tech Tan and

Warren Tice

Intrinsic gettering

Materials Technology

1986

Roger Bastide,

Peter Rose, and

Andrew Wittkower

Ion implantation systems

Process Equipment

C. Arthur Lasch

Automatic wafer prober

Tech. Equipment

Robert Walsh

Chemical-mechanical

wafer polishing

Materials Technology

1985

Guenter Schwuttke

X-ray topography system

Metrology

Jean Hoerni

Planar process

Process Technology

1985

Albert Soffa

Manual and automatic

wire bonders

Assembly Equipment

1984

David Alles,

Robert Collier,

Donald Harriott,

John Stafford, and

Michael Thomson

Electron beam exposure

system

Process Technology

Neal Stouder

Linear and high/low

temperature test system

Test Equipment

Gordon Teal

Silicon transistor

Device Technology

1983

J. Walter Carlson

Silicon quality standards

Materials Technology

Kenneth Levy

Automated photomask

inspection

Metrology

T. Peter Sylvan

Test systems development

Test Equipment

1982

Karl A. Lang

Automatic diffusion

furnaces

Process Equipment

Lawrence Martinson

Negative photoresist

Materials Technology

Lawrence Plummer

Plastic device

encapsulation

Assembly Equipment

1981

Robert Grey,

David Manson, and

Wayne Sanborn

Development of silane

Material Technology

Burton Wheeler

Photorepeating

camera

Process Equipment

Test Systems Group

Sentry test equipment

Test Equipment

1980

Alfred Barsocchi,

Robert Eberly,

Donald McKenzie, and

Alfred Taylor

Commercial doping of

gasses and mixtures

Materials Technology

Kazuo Maeda

Low pressure CVD

Process Equipment

Matt Pennings

Ultrasonic wire bonder

Assembly Equipment

Sheldon Weinig

High purity, highly

characterized materials

Materials Technology

1979

Walter C. Benzing and Mike McNeilly

Epitaxial silicon

deposition

Process Equipment

Jere D. Buckley,

Harold Helmstreet,

David Markle, and

Abe Offner

MICRALIGN projection

mask aligner

Process Equipment

Frederick W. Kulicke, Jr.

Wire bonding and die

attach

Assembly Equipment

Robert Lorenzini

Silicon crystal growth

Materials Technology

Nicolas DeWolfe

Automatic semiconductor

Assembly Equipment

Henry W. Gutsche

Vapor deposition of

polycrystal silicon

Materials Technology

Geoffrey Ryding

Ion implantation equipment

Process Equipment