Foundation for Promotion of Material Science&Technology of Japan

MST was established in 1984 as analysis and evaluation for new materials in state-of-the-art surface and microanalysis. Our main activities are material characterization for semiconductors and related devices. We are specialized analytical capabilities as SIMS, AES, XPS, TEM(+EDX), FE-SEM(+EDX and EBIC), Micro etching and Deposition by FIB, RAMAN, XRD etc.