Nearfield Instruments B.V.
Member Since
2016-10-05
Member ID
270076
位置
Vareseweg 5
Rotterdam
3047
Netherlands
Primary Industry
Semiconductor
Primary Product Category
Equipment and Sub-Systems
Primary Product Sub Category
Metrology/Inspection
Company Profile
Nearfield Instruments has developed revolutionary multiple parallel atomic force microscopy (AFM) technology enabling atom-scale resolution metrology at industry-level throughput (up to 750x of current commercial AFM systems). This enables AFM to complement the in-fab metrology tool set for IC device manufacturing, specifically addressing the metrology needs at the sub-10 nm device generations.